MIA LABS Employee Directory
Semiconductor ManufacturingCalifornia, United States2-10 Employees
Complete SIMS Analysis Solutions for Semiconductor Materials MIA LABS© offers a wide range of SIMS analysis and metrology solutions for Semiconductor Industry and Nanotechnology. Secondary Ion Mass Spectrometry (SIMS) is one of the most advanced techniques for materials characterization capable of ppb level detection for all elements from H to U and sub-nanometer resolution. MIA LABS employs new generation SIMS equipment and world-class scientists to ensure our customers receive most accurate, reliable top-notch SIMS service. From routine process control to new technology development we deliver cost effective SIMS analysis solutions to help our customers solve tough technological problems.